Shenzhen Institutes of Advanced Technology (SIAT) of the Chinese Academy of Sciences, in collaboration with researchers at Central China Normal University, have developed a high-performance perovskite X-ray complementary metal-oxide-semiconductor (CMOS) detector for medical imaging.
Shenzhen Institutes of Advanced Technology (SIAT) of the Chinese Academy of Sciences, in collaboration with researchers at Central China Normal University, have developed a high-performance perovskite X-ray complementary metal-oxide-semiconductor (CMOS) detector for medical imaging.
Share this Article
Recommended